General-Purpose X-ray diffractometer DRON-7
X-ray diffractometer DRON-7 is able to solve a wide range of powder diffraction tasks. Independent rotation around axes.
Technical Data
| Goniometer | ||
|---|---|---|
| Type | Horizontal 2θ-θ | |
| X-ray optics | Bragg-Brentano/Debye-Scherrer/parallel-beam | |
| Raduis R, mm | 200 | |
| Angular range, deg. | 2θ | from -100 to 165 |
| θ | from -180 to 180 | |
| Scanning mode | stepped/continuous | |
| Scanning technique: | θ-2θ, 2θ , θ, 2θ-Ω | |
| Min. scanning step, deg. | 0.001 | |
| Scanning rate, deg./min | from 0.1 to 50 | |
| Reproducibility, deg. | ±0.005 | |
| Travelling speed, deg/min | 720 | |
| Recording system (base): | ||
| Detector type | Scintillation NaI (Tl) | |
| Counting rate, imp/sec | up to 500,000 | |
| High-voltage power source: | ||
| Power supply, kW | 3 | |
| Voltage, KV | 0-60 | |
| Current, mA | 0-80 | |
| Anode current and voltage stability, % | 0.01 | |
| Cooling | air cooling | |
| X-Ray Tube (base): | ||
| Type | 2,5BSV-27Cu | |
| Focus, mm | 10 х 1.6 | |
| Cooling | water cooling (3 l/min) | |
| Performance | ||
| Installation area, m2 | 5 | |
| Power consumption, kVA | 5.5 | |
| Weight, kg | 520 | |
| Power, V/Hz | Single-phase 220/50 | |
| Overall dimensions (L х W х H), mm | 1050 х 1100 х 1800 | |
Drawings
Process Diagram
Advanced Options
Advanced options
| Sample stages, Attachments and chambers | |
|---|---|
 | Stage for bulk samples to install samples with thickness of up to 10 mm and length of up to 100 mm. |
 | Stage for cylindrical samples (capillaries) of 0.1-1.0 mm in diameter to for measure patterns in Debye-Sherrer geometry. |
 | Two-axis χ,φ attachment for analysis of textures and residual stresses in polycrystalline samples and for the determination of crystal orientation up to 28 mm in diameter. |
 | High-temperature chambers (up to 1200°С) for in situ tracing of phase transformation and chemical reactions in changeable environment. |
 | The vacuum system |
 | Autosampler for 6 positions. |
| Registration systems | |
 | X-ray registration system based on linear position-sensitive stripped detector. |
 | X-ray registration system based on solid-state energy-dispersive Peltier-cooled detector. |
| X-ray optical elements | |
 | Versatile primary beam monochromator. |
 | Versatile diffracted beam monochromator. |
 | Different types of crystals-monochromators (plane, asymmetric, curved, channel-cut) from different materials. |
 | One-dimensional parabolic mirror for parallel-beam geometry. |
| Other options | |
 | Closed cooling system (chiller). |
 | BSV- 27…29 and BSV-40…42 X-ray tubes with different of focus sizes and different anode materials. |
 | Soller slits with divergence of 1.5 to 4 degrees for collimation of diffracted beam when point or position-sensitive detectors are used. |
 | β-filters for monochromatization of various X-ray radiations when point or position-sensitive detectors are used. |
Software Interface
Software interface
  | Data processing – DrWin • Processing of diffraction pattern or selection • Background approximation (by polynomial or user curve) • Separation of K-doublets• Peak seach and determination of their anglular positions • Approximation of reflection profiles by pseudo-Voigt function (for the entire array or independently for each peak) • Calculation of peak heights and their integral intensities • Calculation of FWHM of reflections |
 | Quantitative phase analysis – Quan • Overall analysis of multicomponent mixture • Analysis of n-component system • Analysis of sample with known mass absorption coefficient • Method of internal standard • Method of Reference Intensity Ratios (RIR’s) • Method of additives • Method of reduction |
 | Calculation of average size of coherent domains and of microstrains – Size&Strain • Calculation of size of coherent domains and microstrains by the method of second central moments • Calculation of instrumental line broadening • Application of absorption correction to the samples with another composition |
  | Calculation of theoretical diffraction pattern – TheorPattern • Simulation of diffraction patterns of multicomponent mixtures from structural data • Account for of instrumental factor • Account for texture and crystalline size for each component • Comparison of simulated and measured diffraction patterns • Integrated package of geometrical crystallography |
 | Auto indexing of Powder Diffraction Pattern – Ind • Determination of Bravais lattice type • Choice of unit cell • Computation of Miller indices for selected lines • Bar graph of input diffraction pattern |
 | Full profile analysis by Rietveld method – Rietveld • Refinement of crystal structures from X-ray powder diffraction data of single crystalline phases and mixtures • Calculation of polynominal and physical background • Independent refinement of U, V, W, X, Y profile for different phases and for different groups of reflections • Refinement of unit cell parameters, atomic and thermal parameters, occupations of atomic positions for each phase • Choice of refinement strategy • Control of Rrefinement conditions • Calculation of five R-factors |
 | Residual stress analysis – MacroStress • Calculation of peak angular position from center of gravity or from peak topapex • Correcting of correction matrix • Calculation of linear, planar and volumetric stresses • Calculation of stress deviations |
  | High temperature-X-ray diffraction – Thermo • 3D-imaging of measured data in “diffraction angle – intensity – temperature” co-ordinates • Calibration of the measured data set by internal or external standard • Refinement of unit cell parameters of the calibrated data set • Determination of phase transition points • Determination of thermal expansion coefficients (TEC) in different directions and thermal deformation tensors • Building of TEC figures |
 | Qualitative phase analysis and access to the Ppowder Diffraction File database – Retrieve and Search-Match • Use of PDF-2/PDF-4 database of International Center of Diffraction< Data (ICDD) for qualitative analysis • Automatic or manual search algorithm Creation of user subbases for search facilitation • Addition of user standards into subbases • Qualitative phase analysis by different criteria, bases (subbases) Analysis of lines matched by angular position and intensity • Quantitative phase analysis by Reference Intensity Ratios (RIR’s) method • Access to the data base including search by selected criteria |